IJCB 2014
International Joint Conference on Biometrics

29 September - 2 October 2014, Clearwater, Florida, USA
IEEE.org IEEE Biometrics Council International Association for Pattern Recognition
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Program Committee

Gaurav Aggarwal, Yahoo!, India

Lale Akarun, Bogazici University, Turkey

J Alba-Castro, Universidad de Vigo, Spain

Fernando Alonso-Fernandez, Halmstad University, Sweden

Kiran Balagani, New York Institute of Technology, USA

George Bebis, University of Nevada, USA

J Beveridge, Colorado State University, USA

Vijayakumar Bhagavatula, Carnegie Mellon University, USA

Soma Biswas, Yahoo!, India

Chris Boehnen, Oak Ridge National Laboratory, USA

David Bolme, Colorado State University, USA

Patrick Bours, Gjovik University College (HiG), Norway

Kevin Bowyer, University of Notre Dame, USA

Julien Bringer, Morpho, France

Pradeep Buddharaju, University of Houston Clear Lake, USA

Raffaele Cappelli, University of Bologna, Italy

Chi-Ho Chan, University of Surrey, UK

Vinod Chandran, Queensland University of Technology, Australia

Xilin Chen, Institute of Computing Technology, CASIA, China

Heesung Choi, Michigan State University, USA

Antitza Dantcheva, Michigan State University, USA

John Daugman, Cambridge University, UK

Larry Davis, University of Maryland Institute for Advanced Computer Studies, USA

Maria De Marsico, University of Rome La Sapienza, Italy

Farzin Deravi, University of Kent, UK

Jana Dittmann, University of Magdeburg, Germany

Bernadette Dorizzi, Institut National des Télécommunications, France

Andrzej Drygajlo, EPFL, Switzerland

Stephen Elliott, Purdue University, USA

Nicholas Evans, EURECOM, France

Michael Fairhurst, University of Kent, UK

Marcos Faundez-Zanuy, EUP de Mataró, Spain

Miguel Ferrer-Ballester, UPLGC, Spain

Julian Fierrez, Autonomous University of Madrid, Spain

Patrick Flynn, University of Notre Dame, USA

Clinton Fookes, Queensland University of Technology, Australia

Javier Galbally, Universidad Autonoma de Madrid, Spain

Sonia Garcia-Salicetti, Télécom and Management SudParis, France

Berk Gokberk, University of Twente, The Netherlands

Venu Govindaraju, University at Buffalo, SUNY, USA

Patrick Grother, NIST, USA

Guodong Guo, West Virginia University, USA

Hu Han, Michigan State University, USA

Javier Hernando, Universitat Politécnica de Catalunya, Spain

Anil Jain, Michigan State University, USA

Hongjun Jia, Cognex Corporation, USA

Behrooz Kamgar-Parsi, US Naval Research Lab, USA

Jaihie Kim, Yonsei University, Korea

Brendan Klare, Noblis, USA

Oleg Komogortsev, Texas State University, USA

Krzysztof Kryszczuk, PatternLab, Lausanne, Switzerland

Shengcai Liao, Chinese Academy of Sciences, China

Xiaoming Liu, Michigan State University, USA

Gian Luca Marcialis, University of Cagliari, Italy

Vishal M. Patel, University of Maryland Institute for Advanced Computer Studies, USA

Dario Maio, Bologna University, Italy

Emanuela Marasco, West Virginia University, USA

Dimitri Metaxas, Rutgers, The State University of New Jersey, USA

Didier Meuwly, Nederlands Forensisch Instituut (NFI), Netherlands

Aythami Morales, UPLGC, Spain

Abhishek Nagar, Michigan State University, USA

Afzel Noore, West Virginia University, USA

Alice O'Toole, University of Texas, USA

Gang Pan, Zhejiang University, China

Sharath Pankanti, IBM, USA

Unsang Park, Sogang Univerity, Korea

Andreas Pashalidis, KU Leuven, Belgium

Jonathon Phillips, NIST, USA

Hugo Proenca, University of Beira Interior, Portugal

Daniel Ramos, Universidad Autonoma de Madrid, Spain

Fabio Roli, University of Cagliari, Italy

Arun Ross, West Virginia University, USA

Albert Salah, Bogazici University, Turkey

Bulent Sankur, Bogazici University, Turkey

Marios Savvides, Carnegie Mellon University, USA

Walter Scheirer, Harvard University, USA

Natalia Schmid, West Virginia University, USA

Stephanie Schuckers, Clarkson University, USA

Fabio Scotti, University of Milan, Italy

Shishir Shah, University of Houston, USA

Luuk Spreeuwers, University of Twente, The Netherlands

Zhenan Sun, Chinese Academy of Sciences, China

Massimo Tistarelli, University of Sassari, Italy

Raymond Veldhuis, University of Twente, Netherlands

Ruben Vera-Rodriguez, Universidad Autonoma de Madrid, Spain

Yunhong Wang, Beihang University, China

Seong Whan-Lee, Korea University, Korea

Damon Woodard, Clemson University, USA

Bian Yang, Gjøvik University College, Norway

Pong Yuen, Hong Kong Baptist University, HK

Lin Zhang, Tongji University, China

Qijun Zhao, Sichuan University, China

Jinyu Zuo, West Virginia University, USA